Emeritus Professor Jim Williams

Williams, Jim profile
Position Emeritus Professor
Department Materials Physics
Research group
Qualifications BSc PhD NSW, FAA, FTSE, FAIP, FIEAust
Office phone (02) 612 50373
Email
Office John Carver 4 13

GeSn defect properties measured by nanoindentation

To understand defects in metal-semiconductor alloys, specifically GeSn in this project, to help making better alloy films and devices.

Dr Xingshuo Huang, Prof Jodie Bradby, Emeritus Professor Jim Williams