Mr Tom Ratcliff

Mr Tom Ratcliff
Department Department of Electronic Materials Engineering
Office phone (02) 612 50362
Email
Office Cockcroft 4 41

Publications

Journal article

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The effect of annealing ambient on carrier recombination in boron implanted silicon
Physica Status Solidi: Rapid Research Letters 8, 10() 827-830
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Influence of implantation damage on emitter recombination
Energy Procedia 55() 272-279
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Imaging of the relative saturation current density and sheet resistance of laser doped regions via photoluminescence
Journal of Applied Physics 114, 5() 6
Download full publication (PDF 1.4MB)

(3 publications)

Conference paper

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Ion implanted dielectric films for an improved optical and electronic silicon photovoltaic response
2012 MRS Fall Meeting 1493() 105-110

(1 publications)

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