Elliman R Nanoscale materials modification for device applications Ion Beams in Nanoscience and Technology Springer, Berlin (2009) 329-355
Elliman R Semiconductors: Irradiation Effects Encyclopaedia of Materials Science and Technology Elsevier, Netherlands (2001) tba
Elliman R Semiconductor Heterostructures Proceedings of the Tenth Physics Summer School 'Physics of Novel Materials World Scientific, Singapore (1997) 235-253
Kim S, Choi S, Park C, Cho K, Cho H, Elliman R Structural and Optical Characterization of Ge Nanocrystals Showing Large Nonvolatile Memories in Metal-oxide-semiconductor Structures Journal of the Korean Physical Society49, 3(2006) 959-962
Elliman R, Wilkinson A, Smith N, Spooner M, Dall T, Lederer M, Luther-Davies B, Samoc M Light Emission from Silicon Nanocrystals - Size does Matter ! Journal of the Korean Physical Society45(2004) S656-S660
Kim S, Park C, Cho H, Choi S, Elliman R Luminescence Study of Si and Ge Implanted (1-102) Sapphires Journal of the Korean Physical Society45(2004) S501-S504
Cheylan S, Elliman R Effect of Hydrogen on the Photoluminescence of Si Nanocrystals Embedded in a SiO2 Matrix Applied Physics Letters78, 9(2001) 1225-1227
Cheylan S, Elliman R Effect of particle size on the photoluminescence from hydrogen passivated Si nanocrystals in SiO2 Applied Physics Letters78, 13(2001) 1912-1914
Cheylan S, Manson N, Elliman R Dose Dependence of Room Temperature Photoluminescence from Si Implanted SiO2 Journal of Luminescence80(1999) 213-216
Cheylan S, Manson N, Elliman R The effect of ion dose and annealing ambient on room temperature photoluminescence from Si nanocrystals in SiO2 Nuclear Instruments and Methods in Physics Research: Section BB148(1999) 986-990
Choi S, Elliman R Negative Photoconductivity in SiO2 Films Containing Si Nanocrystals Applied Physics Letters74, 26(1999) 3987-3989
Choi S, Elliman R Reversible Charging Effects in SiO2 Films Containing Si Nanocrystals Applied Physics Letters75, 7(1999) 968-970
Dowd A, Elliman R, Samoc M, Luther-Davies B Nonlinear Optical Response of Ge Nanocrystals in a Silica Matrix Applied Physics Letters74, 2(1999) 239-241
Dowd A, Samoc M, Luther-Davies B, Elliman R Nonlinear Optical Properties of Semiconducting Nanocrystal in Fused Silica Nuclear Instruments and Methods in Physics Research: Section BB148(1999) 964-968
Glasko J, Elliman R, Zou J, Cockayne D, Fitzgerald J Defects Formed During 1 MeV Si Ion-Irradiation of GeSi/Si Strained Layer Heterostructures at Elevated Temperature Nuclear Instruments and Methods in Physics Research: Section BB148(1999) 206-210
Goldberg R, Williams J, Elliman R Preferential Amorphization at Extended Defects of Self-Ion-Irradiated-Silicon Physical Review Letters82, 4(1999) 771-774
Ophel T, Timmers H, Elliman R Window Effects in a Large Solid Angle, Position-Sensitive Gas Ionisation Detector for Elastic Recoil Detection Analysis (ERDA) Nuclear Instruments and Methods in Physics Research: Section AA423(1999) 381-393
Elliman R Characterization of thin films using heavy ion beams Bulletin of Materials Science22, 3(1999) 601-606
Glasko J, Elliman R, Fitzgerald J Ion irradiation of GeSi/Si strained-layer heterostructures Materials Research Society Symposium Proceedings540(1999) 55-65
Elliman R The development of a facility for heavy-ion elastic recoil detection analysis at the Australian National University Nuclear Instruments and Methods in Physics Research: Section B136-138(1998) 611-615
Elliman R Limitations to depth resolution in high-energy, heavy-ion elastic recoil detection analysis Nuclear Instruments and Methods in Physics Research: Section B136-138(1998) 649-653
Venkatachalam D, Parkinson P, Ruffell S, Elliman R Optical imaging of graphene using phase shift interferometry Australian Institute of Physics Congress (AIP 2012)?, ?(2012) 1
Kim T, Shalav A, Elliman R The Fabrication of Optically Active Silica Nanowires by Ion-Implantation AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2009)?, ?(2010) 4
Malik A, Belay K, Llewellyn D, Hutchison W, Elliman R Ion beam synthesis of metallic nanoparticles in SiO_2 thin films AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2009)?, ?(2010) 4
Pyke D, Elliman R, McCallum J Hydrogen blister depth and surfcce roughness during the ion-cut process AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2009)?, ?(2010) 5
Saleh M, Venkatachalam D, Kim S, Belay K, Elliman R The effect of ion-implantation on the resistive switching response of NiO thin films AINSE Conference on Nuclear and Complementary Techniques of Analysis (NCTA 2009)?, ?(2010) 4
Venkatachalam D, Fletcher N, Sood D, Elliman R The Growth of Self-assembled Au Nanostructures during the Epitaxial Crystallization of Au-Implanted Amorphous Silicon Layers Australian Conference on Nuclear and Complementary Techniques of Analysis & Vacuum Society of Australia Congress 2009?, ?(2009) 4
Elliman R, Wilkinson A, Kim T, Sekhar P Photonic nanostructures and their influence on Er luminescence Australian Conference on Nuclear and Complementary Techniques of Analysis & Vacuum Society of Australia Congress 2007?, ?(2007) 81-84
Venkatachalam D, Fletcher N, Sood D, Elliman R Surface Fraction Statistics of Gold Nanoclusters of Dissimilar Sizes Determined by RBS Australian Conference on Nuclear and Complementary Techniques of Analysis & Vacuum Society of Australia Congress 2007?, ?(2007)
Smith N, Lederer M, Samoc M, Luther-Davies B, Elliman R Pump-probe Measurements using Silicon Nanocrystal Waveguides Materials Research Society Meeting Spring 2003?, ?(2003) 63-68
Spooner M, Walsh T, Elliman R Effect of Microcavity Structures on the Photoluminescence of Silicon Nanocrystals Materials Research Society Meeting Spring 2003?, ?(2003) 51-56
Wilkinson A, Elliman R Hydrogen Passivation Kinetics of Si Nanocrystals in SiO2 Materials Research Society Meeting Spring 2003770(2003) 81-86
Williams J, Elliman R, Tan H, McGowan P, Wong-Leung J, Jagadish C Production and Processing of Semiconductor Nanocrystals and Nanostructures for Photonic Applications National Conference and Exhibition on Nanotechnology 2003?, ?(2003) 74-80
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