Dr Sanjoy Nandi

Dr Sanjoy Nandi
Position
Research Fellow
Department
Electronic Materials Engineering
Office phone
59089
Email
Office
Cockcroft 4 41

Research publications

Journal article

Nath S, Das S, Nandi S, Xi C, Marquez C, Rua A, Uenuma M, Wang Z, Zhang S, Zhu R, Eshraghian J, Sun X, Lu T, Bian Y, Syed N, Pan W, Wang H, Lei W, Fu L, Faraone L, Lei W, Liu Y, Elliman R
Optically Tunable Electrical Oscillations in Oxide-Based Memristors for Neuromorphic Computing
Advanced Materials ()
Li X, Wang X, Li P, Iu H, Eshraghian J, Nandi S, Nath S, Elliman R
Tri-State Memristors Based on Composable Discrete Devices
International Journal of Bifurcation and Chaos 33, 7()
Nandi S, Nath S, Das S, Murdoch B, Ratcliff T, McCulloch D, Elliman R
Effect of Interdiffusion and Crystallization on Threshold Switching Characteristics of Nb/Nb2O5/Pt Memristors
ACS Applied Materials and Interfaces 15, 50() 58613 - 58622
Nath S, Sun X, Nandi S, Chen X, Wang Z, Das S, Lei W, Faraone L, Rickard W, Elliman R
Harnessing Metal/Oxide Interlayer to Engineer the Memristive Response and Oscillation Dynamics of Two-Terminal Memristors
Advanced Functional Materials 33, 52() 2306428
Das S, Nandi S, Marquez C, Rua A, Uenuma M, Puyoo E, Nath S, Albertini D, Baboux N, Lu T, Liu Y, Haeger T, Riedl T, Ratcliff T, Elliman R
Physical Origin of Negative Differential Resistance in V3O5 and Its Application as a Solid-State Oscillator
Advanced Materials 35, 8() 2208477
Liang Y, Zhu Q, Wang G, Nath S, Ho-Ching Iu H, Nandi S, Elliman R
Universal Dynamics Analysis of Locally-Active Memristors and Its Applications
IEEE Transactions on Circuits and Systems Part I: Regular Papers 69, 3() 1278 - 1290
Nandi S, Das S, Cui Y, El Helou A, Nath S, Ratcliff T, Raad P, Elliman R
Thermal Conductivity of Amorphous NbOx Thin Films and Its Effect on Volatile Memristive Switching
ACS Applied Materials and Interfaces 14, 18() 21270 - 21277
Nandi S, Puyoo E, Nath S, Albertini D, Baboux N, Das S, Ratcliff T, Elliman R
High Spatial Resolution Thermal Mapping of Volatile Switching in NbOx-Based Memristor Using In Situ Scanning Thermal Microscopy
ACS Applied Materials and Interfaces 14, 25() 29025-29031
Wang X, Dong C, Zhou P, Nandi S, Nath S, Elliman R, Ho-Ching Iu H, Mo Kang S, Eshraghian J
Low-Variance Memristor-Based Multi-Level Ternary Combinational Logic
IEEE Transactions on Circuits and Systems Part I: Regular Papers 69, 6()
Liu X, Zhang P, Nath S, Li S, Nandi S, Elliman R
Understanding composite negative differential resistance in niobium oxide memristors
Journal of Physics D: Applied Physics 55, 10() 1-12
Nandi S, Nath S, El-Helou A, Li S, Ratcliff T, Uenuma M, Raad P, Elliman R
Electric Field- And Current-Induced Electroforming Modes in NbOx
ACS Applied Materials and Interfaces 12, 7() 8422-8428
Wei L, Li S, Nandi S, Elliman R
Forming-free bipolar resistive switching and quantum conductance in NiO/FTO structures
Journal of Physics D: Applied Physics 52, 46() 1-5
Nandi S, Venkatachalam D, Ruffell S, England J, Grande P, Vos M, Elliman R
Room temperature synthesis of HfO2/HfO x heterostructures by ion-implantation
Nanotechnology 29, 42() 9
Li S, Liu X, Nandi S, Venkatachalam D, Elliman R
Coupling dynamics of Nb/Nb 2 O 5 relaxation oscillators
Nanotechnology 28, 12() 125201-125201
Marmitt G, Nandi S, Venkatachalam D, Elliman R, Vos M, Grande P
Oxygen diffusion in TiO2 films studied by electron and ion Rutherford backscattering
Thin Solid Films 629() 97-102
Nandi S, Li S, Liu X, Elliman R
Temperature dependent frequency tuning of NbOx relaxation oscillators
Applied Physics Letters 111, 20() 1-4
Liu X, Li S, Nandi S, Venkatachalam D, Elliman R
Threshold switching and electrical self-oscillation in niobium oxide films
Journal of Applied Physics 120, 12()
Li S, Liu X, Nandi S, Venkatachalam D, Elliman R
High-endurance megahertz electrical self-oscillation in Ti/NbOx bilayer structures
Applied Physics Letters 106, 21() 1-4
Marmitt G, Nandi S, Rosa L, Vos M
Analysis of multi-layer ERBS spectra
Journal of Electron Spectroscopy and Related Phenomena 202() 26-32
Liu X, Nandi S, Venkatachalam D, Belay K, Song S, Elliman R
Reduced threshold current in NbO2 selector by engineering device structure
IEEE Electron Device Letters 35, 10() 1055-1057
Nandi S, Llewellyn D, Belay K, Venkatachalam D, Liu X, Elliman R
Effect of Microstructure on Dielectric Breakdown in Amorphous HfO2 Films
Microscopy and Microanalysis 20, 3()
Nandi S, Nath S, Hossain A, Khan J
Effect of Zn Doping on Structural and Magnetic Properties of Ba4Ni2-xZnxFe36O60 Hexaferrites
Journal of Superconductivity and Novel Magnetism 27, 12() 2655-2662
Vos M, Grande P, Venkatachalam D, Nandi S, Elliman R
Oxygen Self-Diffusion in HfO2 Studied by Electron Spectroscopy
Physical Review Letters 112, 17() 1-5
Vos M, Liu X, Grande P, Nandi S, Venkatachalam D, Elliman R
The use of electron Rutherford backscattering to characterize novel electronic materials as illustrated by a case study of sputter-deposited NbOx films
Nuclear Instruments and Methods in Physics Research: Section B 340() 58-62
Grande P, Vos M, Venkatachalam D, Nandi S, Elliman R
Determination of thickness and composition of high-k dielectrics using high-energy electrons
Applied Physics Letters 103, 7() 071911/1-4
Nandi S, Hoque M, Ghosh H, Chowdhury R
Assessment of Wind and Solar Energy Resources in Bangladesh
Arabian Journal for Science and Engineering 38, 11() 3113-3123
Nandi S, Ranjan Ghosh H
A wind-PV-battery hybrid power system at Sitakunda in Bangladesh
Energy Policy 37, 9() 3659-3664

Conference paper

Li S, Liu X, Nandi S, Venkatachalam D, Elliman R
Temperature Dependence of Threshold Switching in NbOx Thin Films
Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2014) () 138-140
Liu X, Nandi S, Venkatachalam D, Li S, Belay K, Elliman R
Finite Element Modeling of Resistive Switching in Nb2O5-based Memory Device
Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2014) () 280-283
Nandi S, Liu X, Li S, Venkatachalam D, Belay K, Elliman R
Resistive Switching Behavior in HfO2 with Nb as an Oxygen Exchange Layer
Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2014) () 290-294

Listing does not show publications before 2000

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