Departmental Seminar

Optimised TEM Sample Preparation Using Controlled Ion Milling

Date & time

Thu 5 Oct 2017, 2–3am

Location

Room:

Huxley Teaching Room H4.20

Audience

Members of RSPE welcome

Contact

(02)61250360
Mr Paul Fischione
Fischione Instruments, Export Pennsylvania

Advanced TEM imaging and analysis allows us to investigate materials at the atomic level making it a key technology for understanding and developing next generation materials. However, to achieve optimal results carefully controlled post-FIB ion milling is required.

FIBs have become commonplace in the preparation of TEM samples. While they are highly effective at rapidly thinning bulk specimens into thin lamellae, their high processing energies can create amorphous layers and implant ions such as gallium which can produce TEM specimens that are not representative of the parent material.

For this reason ion mills are the perfect partner for FIBs for TEM specimen preparation. Their low energies, down to 50eV are ideally suited to final polishing and avoid issues such as amorphisation, implantation and redeposition in FIB-prepared specimens.

These system also include a host of other features that will assist you to prepare optimised samples for TEM such as:

  • Controllable ion beam energy
  • Small target area
  • Adjustable milling angle
  • Specimen rotation
  • Cryogenic specimen cooling

In this presentation, we look at purpose-designed solutions like the NanoMill and PicoMill and optimising their workflows to repeatably and predictably produce optimal TEM specimens.

Updated:  17 August 2017/ Responsible Officer:  Head of Department/ Page Contact:  Physics Webmaster