Nanoindentation

EME houses three indentation systems each with different capabilities and strengths.

TriboIndenter TI 950 High-load system

(Hysitron - 2011)

"George"

  • Maximum load 10 N
  • Optical microscope
  • Scratch capabilities
  • In-situ electrical measurement (nanoECR)
  • A large range of specialist tips including:
    • 1, 2, 5, 10, 20, 50, 100 and 1000 μm radius spherical tips
    • Doped diamond and Transition metal oxide tips for nanoECR

TriboIndenter TI 900 Low-Load system

(Hysitron – 2002, major upgrade 2010)

"Edward"

  • Maximum load 10 mN
  • Optical microscope
  • Scratch capabilities
  • In-situ electrical measurement (nanoECR)
  • Full upgrade to Performech
  • Temperature controlled-stage (-10 to 200 C)
  • Dynamic measurement capabilities (nanoDMA)
  • Modulus mapping
  • Atomic Force Microscope
  • Fluorescence Microscope
  • Spherical and Berkovich tips available

UMIS

(CSIRO - 1997)

"Victoria"

  • Maximum load 1 N
  • Optical microscope
  • In-situ electrical measurement (via metallic films on surfaces)
  • Vacuum sample holder
  • Sample stub for wet-indentation
  • Large range of spherical tips from 1μm to 1mm radius.

Updated:  21 June 2021/ Responsible Officer:  Head of Department/ Page Contact:  Physics Webmaster