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Advanced Materials Characterisation Techniques |
The development of advanced analytical methods has often been necessitated when conventional techniques or equipment have proven inadequate for the question under study. Examples abound and include non-conventional secondary ion mass spectrometry, development of gas detectors for elastic recoil detection and EXAFS technique and beamline development for the Australian Synchrotron. Specifics are given below.
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Characterisation of Amorphous Zones in Ion Implanted Compound Semiconductors
, Mark Ridgway
Isolated amorphous zones created by heavy-ion implantation in compound semiconductors act as precursors for the formation of a continuous amorphous layer. While there are generally two different proposed mechanisms (heterogenous versus homogenous nucleation) for the development of amorphisation in semiconductors under ion bombardment, ambiguity still remains in many cases. The recrystallization of these zones stimulated by energetic particle irradiation or thermal means has been of both fundamental and technical importance for the semiconductor device fabrication industry. Because of the irregular nature of the amorphous-crystalline interface in the case of amorphous zones, such zones exhibit annealing kinetics different from that of continuous planar amorphous layers. In-situ electron microscopy is being used to characterise the evolution of amorphous zones created by low-dose, low-energy heavy ion implantation under electron and thermally assisted recrystallization conditions.
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Differential Thermal Analysis (DSC, DTA and TGA)
Ying Chen
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EXAFS beamline for the Australian Synchrotron
Mark Ridgway,
The Australian Synchrotron, a third-generation light source, is now under construction at Monash University. When open in 2007, 8-10 beamlines are anticipated with one beamline dedicated to the EXAFS technique. The optimium design and configuration of this wiggler-based beamline to best serve the Australian EXAFS community is now under development in consultation with both domestic and overseas collaborators.
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X-ray Powder Diffraction and Thin Film Analysis
Ying Chen
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